Design for Testability - Discovers That A Designed Device

Design for Testability is solution for that. It is a method which only discovers that a designed device is defective or not. After the post-silicon test, if it is discovered defective, trash it, don’t ship to clients, on other hands if it is discovered good, ship it to customers. Visit design for testability at http://www.vayoinfo.com/design-for-testability/